REFRACTIVE INDEX

The author thanks Drs. S. Tomita and H. Izumita at NTT Access Network Service Systems Laboratories (ANSL) and M. Toyonaga at Technical Assistance and Support Center (TASC), NTT East Corporation for their encouragement and helpful suggestions. The author is deeply grateful to M. Uchino at TASC for di[r]

523 2005). Plate of crystalline silicon was coved by oxide layer of 20 µm thickness. Femtosecond beam was focused inside silicon through this layer. An inscribed track produces mechanical stress, which causes index increase in the restricted area located between the track and silica-silicon i[r]

523 2005). Plate of crystalline silicon was coved by oxide layer of 20 µm thickness. Femtosecond beam was focused inside silicon through this layer. An inscribed track produces mechanical stress, which causes index increase in the restricted area located between the track and silica-silicon i[r]

spatial hole burning effect as well as the non-linear gain [1] in the above-threshold analysis.From the threshold characteristic of a DFB LD, a quasi-uniform gain model has beenproposed using the perturbation technique [2]. However, in the analysis, a uniform gainprofile along the cavity and a linear[r]

5 shows UV dose distribution function of the reactor with 8 lamps at flow rate 230 m3/h calculated by using the particle tracks data and Equation 4 ~7, where refractive index:1.5 for qua[r]

index of 3.7. This result has a very similar trend with our previous experiment which was done with a single SiC composite target [5]. The previous result has a very narrow refractive index variation (3.2 to 3.4) with the change of a large RF power range (150 to 300 W), but co-s[r]

12 Propagation of Electromagnetic Waves in Thin Dielectric and Metallic Films Luc Lévesque Royal Military College of Canada Canada 1. Introduction Matrix formalism is a very systematic method to find the reflectance or transmittance in a stratified medium consisting of a pile of thin homogeneous fil[r]

Figure 2.9 shows how changes in refractive index cause a surface duct to form and indicates some typical ray paths within the duct.Near the ground, dn/dhis negative with a magnitude grea[r]

ββτ=− + ± + . 5. Conclusion In conclusion, the TWM in broad-area semiconductor amplifier in nondegenerate condition is investigated theoretically. The coupled-wave equations are derived and analytical solutions are obtained when the intensity of the pump is much larger than that of the signal, but m[r]

Page 4 of 5n =1.7(n = 1.4) shell is depicted at the energies wherethe LSP is excited. As it can be observed, when the shellpresents a smaller refractive index ( bottom) than theembedding matrix, the EM field within the nanowiresdecreases. Moreover, as the shell thickness increases, the[r]

by high-temperature (160◦C) GPC.4.12.2 Condensation Nucleation Light-Scattering Detector (CNLSD)The condensation nucleation light-scattering detector (CNLSD) is an enhancement ofthe standard ELSD for improved sensitivity and linear range. Following evaporationof the mobile phase, a saturated stream[r]

problem (28). For isotropic media, there is no coupling between the TE and TM polarization, but in general we must allow for this coupling by using a dyadic transverse impedance. Scatterers such as thin sheets, with or without a periodic pattern, may be modeled as lumped elements. If the sheets are[r]

the environment. On the othe r hand, if the volume frac-tion of nanoparticles is low, the nanofluid will notabsorb all the incoming solar radi ation. Therefore, theoptical properties of the fluid must be controlled veryprecisely or a nanofluid could actually be detrimental ina solar collector. This[r]

important that their thickness be close to the diffusion length of the charges they transport; this usually constraints the optical design since the resulting thickness of the organic stack is somewhat less than a half-wavelength. In some cases, ITO was used for the anode (hole injection) material.[r]

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