in the oxide/electrolyte interface,while 87.6% of the titanium cations leave the hydroxide/metalinterface, migrate across the barrier layer and are ejected into theelectrolyte without forming oxide.3.7. Crystallization of anodic titanium oxideAs-synthesized ATO nanotubula[r]
mental and practical viewpoints. It has been used in manyindustrial areas including environmental purification, so-lar cell, gas sensors, pigments and cosmetics [6,7].Toexplore novel approaches for the nanostructured titaniasof various nature with the control of the particle size innanometer-scale an[r]
qualities. Therefore, the MLD method with ALD [MLD-ALD] is an ideal fabrication technique for various organic-inorganic nanohybrid thin films.* Correspondence: smm@hanyang.ac.krDepartment of Chemistry, Hanyang University, Seoul, 133-791, South KoreaYoon et al. Nanoscale Research Letters 2012, 7:71ht[r]
on a Varian Cary bio100 spectrometer. PL spectrawere measured on a Hitachi 800 spectrometer witha Xe lamp as the excitation light source. Colloidsolutions in absolute ethanol were prepared ul-trasonically for the UV–Visible and the PLmeasurements.3. Results and discussionA typical TEM image of the a[r]
O (2 vol %) with anodization for various periods (t ) 0.5-8h). The compact and bundle layers introduced during anodization were effectively removed upon simpleultrasonic cleaning in deionized water containing submicrometer particles of Al2O3in a small proportion.The photovoltaic performance of the N[r]
2SKKU Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon, 440-476, Korea3School of Information and Communication Engineering, Sungkyunkwan University, Suwon, 440-476, Korea4Electronics Engineering, Kyungwon University, Senongnam, 461-701, KoreaLarge area of self-organized,[r]
strainFig. 5.13 Modification of stress–strain behaviour of coating materials due to ageing (Hare, 1996)constant, whereas the plastic behaviour (dynamic hardness) was notably affecteddue to ageing.During hardness measurements of paint films, the depth of penetration on inden-ters in the coating should[r]
pletely different WO3nanostructure.Figure 2a, b showed the EDS of two tungsten oxidesamples (Fig. 1a, b). The element component quantitativeresult was presented in Table 1. The EDS pattern in Fig. 2indicated the sample not only consisted of tungsten andoxygen, but also some carbon atoms. The EDS sig[r]
and O2, and good mechanical properties under wet-dry and temperature cycles; has stable chemical properties under fuel cell oxidation conditions and quick start-up capability even at subfreezing temperatures; and is low cost. Polyperuorosulfonic acid (PFSA) and derivatives are the current rst-choi[r]
30 Bates TE, Loesch A, Burnstock G & Clark JB (1995)Immunocytochemical evidence for a mitochondriallylocated nitric oxide synthase in brain and liver. BiochemBiophys Res Commun 213, 896–900.31 Brookes PS (2004) Mitochondrial nitric oxide synthase.Mitochondrion 3, 187–204.32 Gha[r]
competitive to MOSFETs and IGBTs in mid power range applications. A promising method of making high-voltage SJ MOSFETs without costly epitaxial growth is also described in this chapter. The charge compensating structures are created by etching the structured macro-pores, followed by passivating the[r]
a temperature above the glass transition temperature (Tg) (corona-poling), or submitted to photoassisted alignment in order to improve the electric field poling (Sekkat & Dumont, 1992). Azoaromatic derivatives are natural candidates to this application due to their large second-order NLO pro[r]
Maximum Security 2011 cung cấp 2 đường thời gian: các ngày trong tuần (thứ 2 – thứ 6) và cuối tuần (thứ 7, Chủ nhật). Màn hình tiếp theo “Hoàn tất các thiết lập cấu hình tùy chọn” cung cấp thông tin tóm tắt các thông số bạn vừa cấu hình. Nhấn Hoàn tất để kết thúc quá trình thiết lập. Kể từ lúc này,[r]
0− Z1Z < Z0− Z1Z1Z0Z =0MetalOxideFIGURE 36.5 Dishing and erosion in copper CMP process. (From Ouma, D., Modeling of chemical–mechanical polishing for dielectric planarization, Ph.D. Dissertation, Department of Electric Engineering andComputer Science, MIT, Cambridge, 1998.)transforms (FFTs) f[r]